Title: Authors:
Data Additive Residual Learning based Yield Prediction for Semiconductor Manufacturing Youjin Lee (Sungkyunkwan University)*; Yonghan Roh (Sungkyunkwan University)
Knowledge Graph Embedding Based on Graph Neural Network Shuang Liang (University of Electronic Science and Technology of China)*
Towards an AutoML System for Fair Classifications Nico Lässig (University of Stuttgart)*
INTERPRET: An INtegrated and adapTive framEwoRk to support Policy-makers in the urban EnvironmenT Emilia Lenzi (Politecnico di Milano)*
Human-AI Complex Task Planning Sepideh Nikookar (NJIT)*